Micron Technology - Senior Equipment and Process Engineer

• Identify, Diagnose, And Resolve Assembly Process Related Problems

• Coordinate And Execute Process, Equipment, And Material Evaluation / Optimization Initiatives And Implement Changes At the Process Step

• Lead / Participate In Continuous Yield Improvement And Cost Reduction Activities

• Validate And Fan Out New Process Baseline Qualified, Including New Processes, Tools, And/Or Materials For New Product Introduction

• Support SPC/FDC/RMS/APC

• Support Site To Site Portability

• Manage / Audit Material Suppliers To Achieve Quality, Cost, And Risk Management Objectives

• Support Internal And External Audits

The University of Tokyo - Process Engineering, Graduate Researcher

• Reduced polymer solution wastage by 75%, cutting costs by 25%

• Enhanced throughput by 60% through collector plate optimization

• Improved sample yield and deposition area using a 4x4 array of 0.8 mm holes

• Established ideal process parameters: 10 kV, 5.0 µl/min, 8.0 µl/min, and 10 cm

• Developed a cost-effective, scalable 1-step deposition technique

• Innovated a robust 7-step device packaging process

• Addressed fiber sticking issue with an acrylic box

• Identified silicon as an ideal collector

The University of Tokyo - Cleanroom Operations, Graduate Researcher

• Expertise in chrome photomask fabrication.

• Proficient in spin-coating, laser writing, and wet-etching.

• Skilled in SU-8 on Si master fabrication.

• Experienced in replica-molding, sputter deposition, and SEM.

• Safely handled hazardous chemicals.

The University of Tokyo - Instrumentation, Graduate Researcher

• Designed an in-house tensile testing setup.

• Conducted calibration experiments and load cell attachment.

• Developed stress and strain measurement methods.

• Established a DSLR-based strain tracking system.

• Developed a 6-step sample preparation technique.

Indian Institute of Technology, Kanpur (IIT Kanpur) - Instrumentation, Graduate Researcher 

• Collaborated across 3 labs to establish a He-Ne laser setup to detect (15-30 nm) nano-cantilever deflection.

• Developed MATLAB code for optical detection using nano-cantilevers.

• Operated EM-CCD (Andor Solis iXon) in static and kinetic modes.